Measurement and Modeling of Silicon Heterostructure Devices
John D. Cressler
CRC Press
Hardback
200
39417
Drawn from the comprehensive and well-reviewed Silicon Heterostructure Handbook, this volume focuses on measurement and modeling of high-speed conductor devices, a topic that is often absent in the technical literature. The author provides experience-base

Measurement and Modeling of Silicon Heterostructure Devices

  • Publisher: CRC Press
  • ISBN: 9781420066920
  • Availability: Η διαθεσιμότητα των βιβλίων εξαρτάται από τον εκάστοτε εκδότη.
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